SEM - EDX
Scanning Electron Microscopy (SEM) with Energy Dispersive of X-ray emitted electrons (EDX)
Scanning Electron Microscopy (SEM) with Energy Dispersive of X-ray emitted electrons (EDX)
SEM is a microscopy technique that uses electrons to image a sample surface. Compared to optical microscopy, we can magnify more the details of a surface and achieve higher zoom factors. We can see details up to 50 nm depending on the surface. We also have an additional detector of elementary chemical composition of the sample surface. In the same way, we can identify inorganic or metallic contaminations of small size, even not visible to the naked eye. This is possible by collecting the X-ray signal emitted by the surface hit by the scanning electrons.